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Modesto Castrillon-Santana
Universidad de Las Palmas de Gran Canaria
Spain
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Brief Bio
Modesto Castrillon-Santana received the M.Sc. and Ph.D. degrees in computer science from the Las Palmas de Gran Canaria University (ULPGC), in 1992 and 2003, respectively. He is currently a Full Professor with the Department of Computer Science and Systems, ULPGC. His main research activities focus particularly on the automatic facial analysis, covering also different topics related to image processing, perceptual interaction, human-machine interaction, biometrics, and computer graphics. He is a member of the AEPIA and AERFAIIAPR, having coauthored over one hundred fifty articles, including peer-reviewed international journals, book chapters, and conference proceedings. He has acted as an external expert for the Chilean, Italian and Qatar Research Agencies and the Spanish Acceditation Agency. He serves to the community in different conference programme and technical committees. He is currently an Associate Editor of Pattern Recognition Letters and past board member of the IEEE Biometrics Newsletter. ... More >>
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Daniel Riccio
University of Naples, Federico II
Italy
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Brief Bio
Daniel Riccio received the Laurea degree (cum laude) and the Ph.D. degree in computer science from the University of Salerno, Salerno, Italy, in 2002 and 2006, respectively. He is currently an Assistant Professor at the Università di Salerno. His research interests include biometrics, fractal image compression, and indexing. Dr. Riccio has been a member of the Italian Group of Italian Researcher in Pattern Recognition since 2004. He also is Member of the IEEE.Daniel Riccio received the Laurea degree (cum laude) and the Ph.D. degree in computer science from the University of Salerno, Salerno, Italy, in 2002 and 2006, respectively. He is currently an Assistant Professor at the Università di Salerno. His research interests include biometrics, fractal image compression, and indexing. Dr. Riccio has been a member of the Italian Group of Italian Researcher in Pattern Recognition since 2004. He also is Member of the IEEE.